Scanning Electron Microscopes (SEM) – Công ty TNHH TM DV KT Minh Khang //gd-1.com Fri, 04 Oct 2024 08:34:03 +0000 en-US hourly 1 //wordpress.org/?v=6.6.2 //gd-1.com/wp-content/uploads/2021/02/favicon-32x32.png Scanning Electron Microscopes (SEM) – Công ty TNHH TM DV KT Minh Khang //gd-1.com 32 32 Scanning Electron Microscopes (SEM) – Công ty TNHH TM DV KT Minh Khang //gd-1.com/en/san-pham/apreo-chemisem-scanning-electron-microscopes/ Fri, 04 Oct 2024 08:34:03 +0000 //gd-1.com/?post_type=product&p=13755
High-performance imaging with integrated chemical analysis and structural characterization
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The new Thermo Scientific Apreo ChemiSEM System supports your materials science research by simplifying the imaging process, making it accessible to both expert users and newcomers alike. With innovative features like Smart Frame Integration (SFI) and newly developed autofocus and autostigmation functions, it can help you easily obtain clear, high-resolution images as well as results for elemental analysis (EDS) and diffraction (EBSD).

Thermo Scientific ChemiSEM Technology integrates energy dispersive spectroscopy (EDS) capabilities directly into the microscope’s user interface, which simplifies analysis and helps deliver reliable results with minimal user bias. With live quantification algorithms and automated data processing, ChemiSEM Technology delivers speed and accuracy to help you easily uncover hidden features and gain a more comprehensive understanding of your materials.

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Scanning Electron Microscopes (SEM) – Công ty TNHH TM DV KT Minh Khang //gd-1.com/en/san-pham/phenom-particlex-steel-desktop-scanning-electron-microscopes/ Thu, 16 May 2024 07:08:27 +0000 //gd-1.com/?post_type=product&p=12570 Steel microscopy

Metallurgists and researchers in steel manufacturing need scanning electron microscopy (SEM) and energy dispersive X-ray spectroscopy (EDS) data for failure analysis and process improvement. The Thermo Scientific Phenom ParticleX Steel Desktop SEM is a multi-purpose desktop SEM enabling failure analysis and automated characterization of non-metallic inclusions in steel.

Steel inclusion analysis

This versatile solution for high-quality imaging and elemental analysis of steel samples provides the data needed for today’s efficient production of high-value steels. Rapid, easy analysis allows you to quickly respond to customer claims of faults, failures, etc., while the automated steel inclusion analysis provides you insight into the steelmaking process.

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Scanning Electron Microscopes (SEM) – Công ty TNHH TM DV KT Minh Khang //gd-1.com/en/san-pham/phenom-particlex-tc-desktop-scanning-electron-microscopes/ Thu, 16 May 2024 05:02:13 +0000 //gd-1.com/?post_type=product&p=12565 Desktop SEM for component cleanliness analysis

The Thermo Scientific Phenom ParticleX TC Desktop SEM is a multi-purpose desktop SEM enabling technical cleanliness at the microscale.

Materials characterization

A versatile solution for high-quality, in-house analysis, the Phenom ParticleX Desktop SEM gives you the ability to carry out speedy characterization, verification and classification of materials, supporting your production with fast, accurate and trusted data. The system is simple to operate and fast to learn, opening up particle and material analysis to a wider group of users.

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Scanning Electron Microscopes (SEM) – Công ty TNHH TM DV KT Minh Khang //gd-1.com/en/san-pham/phenom-particlex-am-desktop-scanning-electron-microscopes/ Thu, 16 May 2024 04:03:44 +0000 //gd-1.com/?post_type=product&p=12560 Additive manufacturing analysis

The Thermo Scientific Phenom ParticleX Desktop Scanning Electron Microscope (SEM) is a multi-purpose desktop SEM designed for additive manufacturing, delivering purity at the microscale.

It is equipped with a chamber large enough to analyze samples up to 100 mm x 100 mm. The proprietary venting and loading mechanism ensures the fastest vent/load cycle in the world, providing the highest throughput.

With the Phenom ParticleX AM Desktop SEM, you can take in-house control of your data:

  • Monitor critical characteristics of metal powders
  • Enhance your powder-bed and powder-fed additive manufacturing processes
  • Identify particle size distributions, individual particle morphology, and foreign particles
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Scanning Electron Microscopes (SEM) – Công ty TNHH TM DV KT Minh Khang //gd-1.com/en/san-pham/phenom-perception-gsr-desktop-scanning-electron-microscopes/ Thu, 16 May 2024 03:35:18 +0000 //gd-1.com/?post_type=product&p=12555 SEM EDX gunshot residue analysis

Gunshot residue (GSR) analysis plays an important role in the determination if a firearm has been used in a crime. Established GSR analysis techniques are based on the use of a scanning electron microscope (SEM), which is used to scan the sample and find suspect GSR particles. If a suspect particle is found, an energy dispersive spectroscopy (EDS) technique is used to identify the elements in that particle.

The Thermo Scientific Phenom Perception GSR Desktop SEM is the only dedicated SEM specifically designed for gunshot residue analysis. Because the system is automated, it enables you to speed up the analysis process. With no need to change your settings each time, you can immediately focus on the task at hand.

A high-brightness CeB6 source is at the heart of the desktop Phenom system. This means that you can be confident it will provide reliable, long-lasting daily use and won’t need to be replaced unexpectedly. The Phenom Perception GSR Desktop SEM makes gunshot residue analysis on-demand, faster, easier and more reliable than ever before. Perfect for every busy lab that wants to save time and floor space.

  • Dedicated gunshot residue solution
  • Only needs a small lab space
  • Stable operation, available 24/7
  • Long lifetime CeB6 source
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Scanning Electron Microscopes (SEM) – Công ty TNHH TM DV KT Minh Khang //gd-1.com/en/san-pham/phenom-pure-g6-desktop-scanning-electron-microscopes/ Thu, 16 May 2024 03:13:12 +0000 //gd-1.com/?post_type=product&p=12549 Phenom Pure Desktop SEM

The Thermo Scientific Phenom Pure Desktop Scanning Electron Microscope (SEM) is an ideal tool for the transition from light optical to electron microscopy. It is an economical solution for high-resolution imaging, providing the best imaging results in its class.

The Phenom Pure Desktop SEM provides high-quality images thanks to the long-lasting, high-brightness CeB6 source, and offers the market’s fastest loading and imaging time. The very reliable autofocus and automated source alignments make this the most user-friendly system on the market.

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Scanning Electron Microscopes (SEM) – Công ty TNHH TM DV KT Minh Khang //gd-1.com/en/san-pham/phenom-pro-desktop-scanning-electron-microscopes/ Thu, 16 May 2024 02:37:17 +0000 //gd-1.com/?post_type=product&p=12543 Phenom Pro Desktop SEM

The sixth-generation of Thermo Scientific Phenom Pro G6 Desktop SEM fills the gap between light microscopy and floor-model SEM analysis, thus expanding the capabilities of research facilities.

Fast and easy to use, the Phenom Pro G6 Desktop SEM can be used to relieve the burden of routine analysis for common samples from floor-model SEM instruments. Instrument configuration and the sample loading mechanism ensure quick imaging with minimal time spent tuning between experiments.

Facility users of any experience level can quickly begin producing high-quality results with the Phenom Pro G6 Desktop SEM. Its long-lifetime CeB6 source offers high brightness while requiring low maintenance. Additionally, its high stability and small form factor allow the instrument to be used in practically any lab environment; more simply put, it does not require specialized infrastructure or expert oversight.

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Scanning Electron Microscopes (SEM) – Công ty TNHH TM DV KT Minh Khang //gd-1.com/en/san-pham/phenom-prox-desktop-scanning-electron-microscopes/ Wed, 15 May 2024 09:39:23 +0000 //gd-1.com/?post_type=product&p=12535 Phenom Desktop SEM with energy-dispersive X-ray diffraction

The sixth-generation of Thermo Scientific Phenom ProX G6 Desktop SEM fills the gap between light microscopy and floor-model SEM analysis, thus expanding the capabilities of research facilities. It offers fast, high-resolution imaging in addition to an integrated energy-dispersive X-ray diffraction (EDS) detector for robust, easy-to-use, rapid elemental analysis.

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Scanning Electron Microscopes (SEM) – Công ty TNHH TM DV KT Minh Khang //gd-1.com/en/san-pham/phenom-particlex-battery-desktop-scanning-electron-microscopes/ Wed, 15 May 2024 09:08:10 +0000 //gd-1.com/?post_type=product&p=12529 Advanced battery materials analysis

In battery production and research, the quality of materials is becoming critical. Small contaminants in the NCM powder, for example, can have disastrous results in the final product. To trace these contaminants effectively, high-resolution SEM imaging with EDS analysis for chemistry is needed. When fully automated, this combination is a powerful tool for powder quality inspection.

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Scanning Electron Microscopes (SEM) – Công ty TNHH TM DV KT Minh Khang //gd-1.com/en/san-pham/phenom-xl-g2-desktop-scanning-electron-microscopes/ Wed, 15 May 2024 08:06:57 +0000 //gd-1.com/?post_type=product&p=12523 Phenom XL G2 Desktop SEM applications

The next-generation Thermo Scientific Phenom XL G2 Desktop Scanning Electron Microscope (SEM) automates your quality control process, providing accurate, reproducible results while freeing up time for value-added work.

The Phenom XL G2 Desktop SEM allow you to:

  • Obtain the quality information you need to discover failures early and rapidly adjust your production process when needed.
  • Automate quality control to process a high volume of samples with fewer chances of human error.
  • Get up to speed quickly with an all-new, easy-to-learn interface ideal for a wide range of applications.

The Phenom XL G2 Desktop SEM features full-screen images and an average time-to image of 60 seconds. The unique CeB6 electron source offers a long lifetime with less maintenance. The small form factor requires little lab space, allowing you to place the microscope exactly where you need it.

Phenom XL G2 Argon-Compatible Desktop SEM

The Thermo Scientific Phenom XL G2 Argon-Compatible Desktop Scanning Electron Microscope (SEM) automates your workflows while providing a stable, non-reactive environment for your reactive sample research.

The Phenom XL G2 Argon-Compatible Desktop SEM offers your research:

  • A non-reactive environment to conduct reactive sample research on samples such as solid state lithium batteries
  • A modality where you can have sample preparation and SEM/EDX analysis in the same workspace
  • A safer way to interface with highly volatile samples such as solid state lithium, enabling the next generation of longer-lasting, eco-friendly batteries

The Phenom XL G2 Argon-Compatible Desktop SEM boasts the same 60-second time to image as the Phenom XL G2 SEM, while also being able to be placed in an argon glove box, assuring the safe analysis of solid state lithium.

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Scanning Electron Microscopes (SEM) – Công ty TNHH TM DV KT Minh Khang //gd-1.com/en/san-pham/phenom-pharos-g2-desktop-feg-sem-desktop-scanning-electron-microscopes/ Wed, 15 May 2024 06:41:44 +0000 //gd-1.com/?post_type=product&p=12518 Field emission gun scanning electron microscope

The Thermo Scientific Phenom Pharos G2 FEG-SEM brings field emission SEM to your tabletop. The Phenom Pharos G2 FEG-SEM will outperform many floor-standing SEMs in terms of image quality, while offering a vastly better user experience. For academic and industrial laboratories that so far did not consider SEM a realistic option, the Phenom Pharos G2 FEG-SEM makes FEG performance accessible thanks to its attractive form factor and short training required. Blazing fast sample loading means fast sample exchange, which means higher productivity. Unlike other SEMs, which end up being fully booked, the Phenom Pharos G2 FEG-SEM performs imaging and analysis jobs so quickly that it serves well as a walk-up tool.

The new Phenom Pharos G2 FEG-SEM expands its acceleration voltage range down to 1 kV, to better accommodate insulating and beam-sensitive samples, and up to 20 kV, with a resolution of 2.0 nm that reveals the finest details.

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Scanning Electron Microscopes (SEM) – Công ty TNHH TM DV KT Minh Khang //gd-1.com/en/san-pham/volumescope-2-sem-scanning-electron-microscope/ Thu, 28 Mar 2024 09:29:14 +0000 //gd-1.com/?post_type=product&p=12062 Volumescope 2 Scanning Electron Microscope for serial block face imaging

The Thermo Scientific Volumescope 2 Scanning Electron Microscope (SEM) is our state-of-the-art serial block-face imaging system. Keep control of experiments with easy to use technology and protect a wide range of possible samples with tried and tested solutions for every acquisition step.

Block face imaging

Unraveling the complex 3D architecture of cells and tissues in their natural context is crucial for structure-function correlation in biological systems and soft materials. Serial block-face SEM (SBF-SEM) combines in situ sectioning and imaging of plastic-embedded tissue blocks within the SEM vacuum chamber for automated, 3D reconstruction of large tissue volumes. Axial resolution was once limited by the minimum section thickness, but truly isotropic resolution is now possible with the addition of multi-energy deconvolution.

3D SEM

Following in situ sectioning of the block-face using a diamond knife, the freshly exposed tissue is imaged several times using increasing accelerating voltages. These images are subsequently used in a deconvolution algorithm to derive several optical subsurface layers, forming a 3D subset. By repeating this cycle, the Volumescope 2 SEM offers isotropic datasets with 10 nm Z-resolution.

Polymer microstructures

High-resolution imaging in 3D is of great importance when trying to understand the microstructure and properties of polymer materials. The Volumescope 2 SEM combines in situ sectioning and imaging of polymers within the SEM vacuum chamber, in a fully automated fashion, for reconstruction of large volumes with truly isotropic 3D resolution. Visualizing a large volume at such resolutions is critical for revealing how regions with different microstructures affect the overall properties of the material. For example, the Volumescope 2 SEM can recreate a large representative volume of a filtration membrane, providing accurate transport properties that lead to enhanced performance predictions for new filter designs.

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