Scanning Electron Microscopes – Công ty TNHH TM DV KT Minh Khang //gd-1.com Fri, 14 Jul 2023 02:11:26 +0000 en-US hourly 1 //wordpress.org/?v=6.1.4 //gd-1.com/wp-content/uploads/2021/02/favicon-32x32.png Scanning Electron Microscopes – Công ty TNHH TM DV KT Minh Khang //gd-1.com 32 32 Scanning Electron Microscopes – Công ty TNHH TM DV KT Minh Khang //gd-1.com/en/san-pham/multisem-electron-microscopes/ Tue, 09 May 2023 03:34:19 +0000 //gd-1.com/?post_type=product&p=7924 Unleash the acquisition speed of up to 91 parallel electron beams â€?to image samples in the centimeter scale at nanometer resolution. This unique scanning electron microscope is designed for continuous, reliable 24/7 operation. Simply set up your high-throughput data acquisition workflow and MultiSEM will acquire high-contrast images automatically.
  • Unprecedented imaging speed
  • ​​Automated large-area image acquisition
  • Nanoscale details in the macroscopic context
  • High-contrast images at low noise levels
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Revolutionize the Speed of Electron Microscopy

Multiple electron beams working in parallel give you unprecedented gross imaging speed. Acquiring an area of 1 mm2 at 4 nm pixel size takes only a few minutes. The unrivaled acquisition speed of more than 1 TB per hour enables imaging of large volumes (> 1 mm3)  at nanometer resolution. Optimized detectors collect the secondary electron signals very efficiently, providing you with high contrast images at low noise levels.

Image Huge Samples at Nanometer Resolution

Don’t sacrifice sample size for nanometer resolution. MultiSEM is equipped with a sample holder covering an area of 10 cm × 10 cm and built for continuous 24/7 operation. You can finally image the entire sample and discover everything you need to answer your scientific questions. You get the detailed picture�without losing the macroscopic context.

Electron Microscopy with ZEN Imaging Software

By introducing ZEN to MultiSEM, we bring the standard software for ZEISS light microscopes to the world of electron microscopy. Control MultiSEM in a straightforward, intuitive way: Smart auto-tuning routines support you as you capture optimal images with high resolution and quality. You quickly set up even complex automated acquisition procedures, adapted and tuned to your sample imaging.

]]> Scanning Electron Microscopes – Công ty TNHH TM DV KT Minh Khang //gd-1.com/en/san-pham/crossbeam-focused-ion-beam-scanning-electron-microscopy-fib-sem/ Mon, 08 May 2023 09:16:20 +0000 //gd-1.com/?post_type=product&p=7914 Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB). You may be working in a multi-user facility, as an academic or in an industrial lab. Take advantage of ZEISS Crossbeam’s modular platform concept and upgrade your system with growing needs, e.g. with the LaserFIB for massive material ablation. During milling, imaging or when performing 3D analytics Crossbeam will speed up your FIB applications.
  • Maximize your SEM insights
  • Increase your FIB sample throughput
  • Experience best 3D resolution in your FIB-SEM analysis
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Maximize Your SEM Insights

  • Take advantage of achieving up to 30% better SEM resolution at low voltage using Tandem decel, a feature of the novel ZEISS Gemini electron optics.â€?/li>
  • Extract true sample information from your high resolution SEM images using Gemini electron optics.â€?/li>
  • Count on the SEM performance of your Crossbeam for 2D surface sensitive images or when performing 3D tomographyâ€?
  • Benefit from high resolution, contrast and signal-to-noise ratios, even when using very low accelerating voltagesâ€?
  • Characterize your sample comprehensively with a range of detectors. Get pure materials contrast with the unique Inlens EsB detectorâ€?/li>
  • Investigate non-conductive specimens undisturbed by charging artifacts.

Increase Your FIB Sample Throughput�/span>

  • Profit from speed and precision of intelligent FIB scanning strategies for material removal and perform your experiments up to 40% faster than before.â€?/li>
  • The Ion-sculptor FIB column introduces a new way of FIB-processing: by minimizing sample damage you’ll maximize sample quality and perform experiments faster at the same time. â€?/li>
  • Manipulate your samples precisely and fast by using up to 100 nA current without compromising FIB resolution.â€?/li>
  • When preparing TEM samples use the low voltage capabilities of the Ion-sculptor FIB: get ultra-thin samples while keeping amorphization damage at a minimum.â€?/li>

Experience Best 3D Resolution in Your FIB-SEM Analysis

  • Enjoy the benefits of integrated 3D analysis for EDS and EBSD investigations.â€?/li>
  • During milling, imaging or when performing 3D analytics Crossbeam will speed up your FIB applications.â€?/li>
  • Expand the capacity of your Crossbeam with ZEISS Atlas 5, the market-leading package for fast, precise tomographyâ€?
  • Perform EDS and EBSD analysis during tomography runs with the integrated 3D Analytics module of Atlas 5â€?
  • Profit from best 3D resolution and leading isotropic voxel size in FIB-SEM tomography. Probe less than 3 nm in depth and produce surface sensitive, material contrast images using the Inlens EsB detectorâ€?
  • Save time by collecting your serial section images while milling. Take advantage of trackable voxel sizes and automated routines for active control of image qualityâ€?
]]> Scanning Electron Microscopes РC̫ng ty TNHH TM DV KT Minh Khang //gd-1.com/en/san-pham/geminisem-field-emission-scanning-electron-microscopes-fe-sem/ Mon, 08 May 2023 08:11:42 +0000 //gd-1.com/?post_type=product&p=7906 ZEISS GeminiSEM stands for effortless imaging with sub-nanometer resolution. These FE-SEMs (field emission scanning electron microscope) combine excellence in imaging and analytics. Innovations in electron optics and a new chamber design let you benefit from better image quality, usability and flexibility. Take sub-nanometer images below 1 kV without an immersion lens. Discover three unique designs of the ZEISS Gemini electron optics.
  • Ideal for core facilities - ZEISS GeminiSEM 360
  • Enabling efficient analysis - ZEISS GeminiSEM 460
  • New standard for surface imaging â€?ZEISS GeminiSEM 560
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Applications in Materials Science

  • Image and analyze any real-world sample effortlessly, over large areas or at sub-nanometer resolution.
  • Explore examples from nanoscience, engineering and energy materials, or bio-inspired materials, polymers & catalysts.
  • See how GeminiSEM helps you to characterize your specimen comprehensively.

Microscopy Solutions for Industry

  • Failure analysis on mechanical, optical or electronic components
  • Fracture analysis and metallography
  • Surface, microstructure and device characterization
  • Compositional and phase distribution
  • Impurity and inclusion determination

Applications in Electronics & Semiconductor

  • Construction analysis and benchmarking
  • Passive voltage contrast
  • Subsurface analysis
  • Electronic property measurement with probing
  • TEM site selection

Applications in Life Sciences

  • Characterization of topology
  • Imaging sensitive, non-conductive, outgassing, or low contrast samples
  • Visualizing the ultrastructure of cells, tissues etc. at high resolutions
  • Imaging very large areas such as serial sections or block faces
]]> Scanning Electron Microscopes РC̫ng ty TNHH TM DV KT Minh Khang //gd-1.com/en/san-pham/sigma-family-field-emission-sem/ Wed, 19 Oct 2022 06:37:32 +0000 //gd-1.com/?post_type=product&p=6658

FE-SEM for High-Quality Imaging & Advanced Analytical Microscopy

The ZEISS Sigma family combines field emission scanning electronic microscope (FE-SEM) technology with an excellent user experience. Structure your imaging and analysis routines and increase productivity.
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Choose from a suite of detector options. Enter the world of high-end imaging: Sigma 300 delivers excellence in price and performance while Sigma 500’s best-in-class EDS geometry offers superb analytical performance.

  • Flexible detection for clear images
  • Automate and speed up your workflow
  • Perform advanced analytical microscopy
]]> Scanning Electron Microscopes РC̫ng ty TNHH TM DV KT Minh Khang //gd-1.com/en/san-pham/evo-family-scanning-electron-microscope/ Wed, 19 Oct 2022 04:34:35 +0000 //gd-1.com/?post_type=product&p=6656

Modular SEM Platform for Intuitive Operation, Routine Investigations and Research Applications

The instruments of the EVO family combine high performance scanning electron microscopy with an intuitive, user-friendly experience that appeals to both trained microscopists and new users.
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With its comprehensive range of available options, EVO can be tailored precisely to your requirements, whether you are in life sciences, material sciences, or routine industrial quality assurance and failure analysis.

  • Versatile solution for central microscopy facilities or industrial quality assurance laboratories
  • Excellent images from any real-world sample
  • Maximum image quality with the lanthanum hexaboride (LaB6) emitter
  • Imaging and analytical excellence on non-conductive and uncoated samples
  • Workflow automation and data integrity
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