Helios 5 EXL – Công ty TNHH TM DV KT Minh Khang //gd-1.com Thu, 16 May 2024 08:21:44 +0000 en-US hourly 1 //wordpress.org/?v=6.6.2 //gd-1.com/wp-content/uploads/2021/02/favicon-32x32.png Helios 5 EXL – Công ty TNHH TM DV KT Minh Khang //gd-1.com 32 32 Helios 5 EXL – Công ty TNHH TM DV KT Minh Khang //gd-1.com/en/san-pham/helios-5-exl-focused-ion-beam-scanning-electron-microscope-fib-sem/ Mon, 01 Apr 2024 03:47:41 +0000 //gd-1.com/?post_type=product&p=12105 Demand for high-performance, energy-efficient electronics is driving the development of advanced devices with ever smaller, more densely packed features and complex 3D structures. Ramping production of these cutting-edge microprocessors, memory devices, and other products is extremely challenging and requires high-resolution, atomic-scale analysis of features buried deep within the device. Transmission electron microscopy (TEM) is increasingly becoming the go-to technique for this kind of analysis and relies on high-quality samples produced with focused ion beam (FIB) milling.

The Thermo Scientific Helios 5 EXL DualBeamis a 300mm full-wafer focused ion beam scanning electron microscope (FIB-SEM), designed to address TEM sample preparation challenges in the semiconductor industry. The Helios 5 EXL DualBeam is capable of preparing samples for today’s most advanced process nodes, including sub-5nm and gate-all-around technology.

Maximizing sample throughput and productivity

Utilizing advanced machine learning and closed-loop end pointing, the Helios 5 EXL DualBeam delivers enhanced cut placement precision and enables you to consistently extract high-quality lamella from your most challenging samples.

Advanced machine-learning automation capabilities make ultra-thin TEM sample generation routine and consistent, providing unparalleled, sub-nanometer insight into more interfaces, films, and profiles to measure at sub-nanometer resolution. The Helios 5 EXL DualBeam ensures efficient and consistent TEM sample preparation workflows by combining wafer and defect navigation with recipe definition and execution in a single, fully integrated program. This automation supports a higher tool-to-operator ratio, maximizing sample throughput and technical resource productivity.

]]>