Helios 5 PFIB – Công ty TNHH TM DV KT Minh Khang //gd-1.com Thu, 16 May 2024 08:33:01 +0000 en-US hourly 1 //wordpress.org/?v=6.6.2 //gd-1.com/wp-content/uploads/2021/02/favicon-32x32.png Helios 5 PFIB – Công ty TNHH TM DV KT Minh Khang //gd-1.com 32 32 Helios 5 PFIB – Công ty TNHH TM DV KT Minh Khang //gd-1.com/en/san-pham/helios-5-pfib-focused-ion-beam-scanning-electron-microscope-fib-sem/ Mon, 01 Apr 2024 07:07:33 +0000 //gd-1.com/?post_type=product&p=12117 Plasma focused ion beam instrument

The Thermo Scientific Helios 5 Plasma FIB (PFIB) DualBeam (focused ion beam scanning electron microscope, or FIB-SEM) delivers unmatched capabilities for materials science and semiconductor applications. For materials science researchers, the Helios 5 PFIB DualBeam provides large-volume 3D characterization, gallium-free sample preparation, and precise micromachining. For manufacturers of semiconductor devices, advanced packaging technology, and display devices, the Helios 5 PFIB DualBeam delivers damage-free, large-area de-processing, fast sample preparation, and high-fidelity failure analysis.

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