Verios 5 XHR SEM – Công ty TNHH TM DV KT Minh Khang //gd-1.com Thu, 16 May 2024 07:53:28 +0000 en-US hourly 1 //wordpress.org/?v=6.6.2 //gd-1.com/wp-content/uploads/2021/02/favicon-32x32.png Verios 5 XHR SEM – Công ty TNHH TM DV KT Minh Khang //gd-1.com 32 32 Verios 5 XHR SEM – Công ty TNHH TM DV KT Minh Khang //gd-1.com/en/san-pham/verios-5-xhr-sem-scanning-electron-microscopy/ Thu, 28 Mar 2024 05:00:14 +0000 //gd-1.com/?post_type=product&p=12032 Verios 5 XHR Scanning Electron Microscope

The Verios 5 XHR SEM offers subnanometer resolution over the full 1 keV to 30 keV energy range with excellent materials contrast. Unprecedented levels of automation and ease-of-use make this performance accessible to users of any experience level.

Scanning electron microscopy characterization

  • High resolution nanomaterial imaging with the UC+ monochromated electron source for sub-nanometer performance from 1-30 kV.
  • High contrast on sensitive materials with excellent performance down to 20 eV landing energy and high-sensitivity in-column and below-the-lens detectors and signal filtering for low-dose operation and optimal contrast selection.
  • Greatly reduced time to nanoscale information for users with any experience level using the Elstar electron column featuring SmartAlign and FLASH technologies.
  • Consistent measurement results with ConstantPower lenses, electrostatic scanning and a choice of two piezoelectric stages.
  • Flexibility for accessories with a large chamber.
  • Unattended SEM operation with Thermo Scientific AutoScript 4 Software, an optional Python-based application programming interface.
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