{"id":12090,"date":"2024-03-29T09:15:39","date_gmt":"2024-03-29T09:15:39","guid":{"rendered":"https:\/\/gd-1.com\/?post_type=product&#038;p=12090"},"modified":"2024-05-16T08:33:56","modified_gmt":"2024-05-16T08:33:56","slug":"helios-6-hd-focused-ion-beam-scanning-electron-microscope-fib-sem","status":"publish","type":"product","link":"https:\/\/gd-1.com\/en\/san-pham\/helios-6-hd-focused-ion-beam-scanning-electron-microscope-fib-sem\/","title":{"rendered":"Helios 6 HD &#8211; Focused Ion Beam Scanning Electron Microscope (FIB-SEM)"},"content":{"rendered":"<div id=\"ez-toc-container\" class=\"ez-toc-v2_0_69_1 counter-hierarchy ez-toc-counter ez-toc-grey ez-toc-container-direction\">\n<div class=\"ez-toc-title-container\">\n<label class=\"ez-toc-title ez-toc-toggle\" style=\"cursor:pointer\">T\u00f3m t\u1eaft n\u1ed9i dung<\/label>\n<span class=\"ez-toc-title-toggle\"><a href=\"#\" class=\"ez-toc-pull-right ez-toc-btn ez-toc-btn-xs ez-toc-btn-default ez-toc-toggle\" aria-label=\"Toggle Table of Content\"><span class=\"ez-toc-js-icon-con\"><span class=\"\"><span class=\"eztoc-hide\" style=\"display:none;\">Toggle<\/span><span class=\"ez-toc-icon-toggle-span\"><svg style=\"fill: #0a0a0a;color:#0a0a0a\" xmlns=\"http:\/\/www.w3.org\/2000\/svg\" class=\"list-377408\" width=\"20px\" height=\"20px\" viewBox=\"0 0 24 24\" fill=\"none\"><path d=\"M6 6H4v2h2V6zm14 0H8v2h12V6zM4 11h2v2H4v-2zm16 0H8v2h12v-2zM4 16h2v2H4v-2zm16 0H8v2h12v-2z\" fill=\"currentColor\"><\/path><\/svg><svg style=\"fill: #0a0a0a;color:#0a0a0a\" class=\"arrow-unsorted-368013\" xmlns=\"http:\/\/www.w3.org\/2000\/svg\" width=\"10px\" height=\"10px\" viewBox=\"0 0 24 24\" version=\"1.2\" baseProfile=\"tiny\"><path d=\"M18.2 9.3l-6.2-6.3-6.2 6.3c-.2.2-.3.4-.3.7s.1.5.3.7c.2.2.4.3.7.3h11c.3 0 .5-.1.7-.3.2-.2.3-.5.3-.7s-.1-.5-.3-.7zM5.8 14.7l6.2 6.3 6.2-6.3c.2-.2.3-.5.3-.7s-.1-.5-.3-.7c-.2-.2-.4-.3-.7-.3h-11c-.3 0-.5.1-.7.3-.2.2-.3.5-.3.7s.1.5.3.7z\"\/><\/svg><\/span><\/span><\/span><\/a><\/span><\/div>\n<nav><ul class='ez-toc-list ez-toc-list-level-1 eztoc-toggle-hide-by-default' ><li class='ez-toc-page-1 ez-toc-heading-level-2'><a class=\"ez-toc-link ez-toc-heading-1\" href=\"https:\/\/gd-1.com\/en\/san-pham\/helios-6-hd-focused-ion-beam-scanning-electron-microscope-fib-sem\/#TEM_sample_preparation_instrument_availability\" title=\"TEM sample preparation instrument availability\">TEM sample preparation instrument availability<\/a><\/li><li class='ez-toc-page-1 ez-toc-heading-level-2'><a class=\"ez-toc-link ez-toc-heading-2\" href=\"https:\/\/gd-1.com\/en\/san-pham\/helios-6-hd-focused-ion-beam-scanning-electron-microscope-fib-sem\/#TEM_sample_preparation_throughput\" title=\"TEM sample preparation throughput\">TEM sample preparation throughput<\/a><\/li><li class='ez-toc-page-1 ez-toc-heading-level-2'><a class=\"ez-toc-link ez-toc-heading-3\" href=\"https:\/\/gd-1.com\/en\/san-pham\/helios-6-hd-focused-ion-beam-scanning-electron-microscope-fib-sem\/#TEM_sample_quality\" title=\"TEM sample quality\">TEM sample quality<\/a><\/li><li class='ez-toc-page-1 ez-toc-heading-level-2'><a class=\"ez-toc-link ez-toc-heading-4\" href=\"https:\/\/gd-1.com\/en\/san-pham\/helios-6-hd-focused-ion-beam-scanning-electron-microscope-fib-sem\/#TEM_metrology\" title=\"TEM metrology\">TEM metrology<\/a><\/li><\/ul><\/nav><\/div>\n<div class=\"cmp-sectiontitle\">\n<div class=\"cmp-sectiontitle\">\n<h2 id=\"availability\" class=\"cmp-sectiontitle__text\" data-anchor-nav-title=\"Availability\"><span class=\"ez-toc-section\" id=\"TEM_sample_preparation_instrument_availability\"><\/span><strong>TEM sample preparation instrument availability<\/strong><span class=\"ez-toc-section-end\"><\/span><\/h2>\n<\/div>\n<div class=\"aem-Grid aem-Grid--12 aem-Grid--default--12 \">\n<div class=\"cmp-p-container aem-GridColumn aem-GridColumn--default--12\">\n<div id=\"container-82127a5a0f\" class=\"cmp-container\">\n<div class=\"aem-Grid aem-Grid--12 aem-Grid--default--12 aem-Grid--phone--12 \">\n<div class=\"cmp-p-container p-l1 aem-GridColumn--default--none aem-GridColumn--phone--none aem-GridColumn--phone--12 aem-GridColumn aem-GridColumn--default--6 aem-GridColumn--offset--phone--0 aem-GridColumn--offset--default--0\">\n<div id=\"container-7044fed3af\" class=\"cmp-container\">\n<div class=\"cmp-p-text mt-l1\">\n<div id=\"text-768410381\" class=\"cmp-text\">\n<p>The Helios 6 HD FIB-SEM maximizes system utilization and reduces operating costs with its new Osprey FIB column. The Osprey FIB column with enhanced automated source and column alignments reduces the need for operator and service technician intervention. Additionally, the new Thermo Scientific EasyLift NanoManipulator extends needle life and reduces needle change time to minimize production interruptions.<\/p>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<div class=\"aem-Grid aem-Grid--12 aem-Grid--default--12 \">\n<div class=\"cmp-p-container aem-GridColumn aem-GridColumn--default--12\">\n<div id=\"container-82127a5a0f\" class=\"cmp-container\">\n<div class=\"aem-Grid aem-Grid--12 aem-Grid--default--12 aem-Grid--phone--12 \">\n<div class=\"cmp-p-container p-l1 aem-GridColumn--default--none aem-GridColumn--phone--none aem-GridColumn--phone--12 aem-GridColumn aem-GridColumn--default--6 aem-GridColumn--offset--phone--0 aem-GridColumn--offset--default--0\">\n<div id=\"container-7044fed3af\" class=\"cmp-container\">\n<div class=\"cmp-p-text mt-l1\">\n<div id=\"text-768410381\" class=\"cmp-text\">\n<div class=\"cmp-sectiontitle\">\n<div class=\"cmp-sectiontitle\">\n<h2 id=\"throughput\" class=\"cmp-sectiontitle__text\" data-anchor-nav-title=\"Sample Prep Throughput\"><span class=\"ez-toc-section\" id=\"TEM_sample_preparation_throughput\"><\/span><strong>TEM sample preparation throughput<\/strong><span class=\"ez-toc-section-end\"><\/span><\/h2>\n<\/div>\n<div class=\"aem-Grid aem-Grid--12 aem-Grid--default--12 \">\n<div class=\"cmp-p-container aem-GridColumn aem-GridColumn--default--12\">\n<div id=\"container-f0a9f57d94\" class=\"cmp-container\">\n<div class=\"aem-Grid aem-Grid--12 aem-Grid--default--12 aem-Grid--phone--12 \">\n<div class=\"cmp-p-container p-l1 aem-GridColumn--default--none aem-GridColumn--phone--none aem-GridColumn--phone--12 aem-GridColumn aem-GridColumn--default--12 aem-GridColumn--offset--phone--0 aem-GridColumn--offset--default--0\">\n<div id=\"container-60fccd0ccf\" class=\"cmp-container\">\n<div class=\"cmp-p-text mt-l1\">\n<div id=\"text-588026449\" class=\"cmp-text\">\n<p>The Helios 6 HD FIB-SEM features Thermo Scientific AutoTEM 6 Software, which performs automated alignments and enhances grid management for faster setup. An all-new digital scan engine allows simultaneous SEM imaging and milling, while also providing precise scan rotation and accurate pattern positioning.\u00a0These hardware and software innovations maximize site-specific sample throughput.<\/p>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<div class=\"aem-Grid aem-Grid--12 aem-Grid--default--12 \">\n<div class=\"cmp-p-container aem-GridColumn aem-GridColumn--default--12\">\n<div id=\"container-f0a9f57d94\" class=\"cmp-container\">\n<div class=\"aem-Grid aem-Grid--12 aem-Grid--default--12 aem-Grid--phone--12 \">\n<div class=\"cmp-p-container p-l1 aem-GridColumn--default--none aem-GridColumn--phone--none aem-GridColumn--phone--12 aem-GridColumn aem-GridColumn--default--12 aem-GridColumn--offset--phone--0 aem-GridColumn--offset--default--0\">\n<div id=\"container-60fccd0ccf\" class=\"cmp-container\">\n<div class=\"cmp-p-text mt-l1\">\n<div id=\"text-588026449\" class=\"cmp-text\">\n<div class=\"cmp-sectiontitle\">\n<div class=\"cmp-sectiontitle\">\n<h2 id=\"sample-quality\" class=\"cmp-sectiontitle__text\" data-anchor-nav-title=\"Sample Quality\"><span class=\"ez-toc-section\" id=\"TEM_sample_quality\"><\/span><strong>TEM sample quality<\/strong><span class=\"ez-toc-section-end\"><\/span><\/h2>\n<\/div>\n<div class=\"aem-Grid aem-Grid--12 aem-Grid--default--12 \">\n<div class=\"cmp-p-container aem-GridColumn aem-GridColumn--default--12\">\n<div id=\"container-d5b6092ccb\" class=\"cmp-container\">\n<div class=\"aem-Grid aem-Grid--12 aem-Grid--default--12 aem-Grid--phone--12 \">\n<div class=\"cmp-p-container p-l1 aem-GridColumn--default--none aem-GridColumn--phone--none aem-GridColumn--phone--12 aem-GridColumn aem-GridColumn--default--6 aem-GridColumn--offset--phone--0 aem-GridColumn--offset--default--0\">\n<div id=\"container-bc33ce055c\" class=\"cmp-container\">\n<div class=\"cmp-p-text mt-l1\">\n<div id=\"text-44194218\" class=\"cmp-text\">\n<p>Sample success rate and quality are of paramount importance, regardless of the type of sample or the sample complexity. Failure analysis labs are expected to deliver high-quality TEM data from every metrology or defect analysis sample.<\/p>\n<p>The Helios 6 HD FIB-SEM contains a new digital scan engine and FIB-SEM control architecture, which provides manual or semi-automated end-pointing for precise isolation of the feature of interest within the sample. In addition, the new Osprey FIB column provides improved low-kV milling. These features combine to deliver high-quality TEM samples, to help you answer the most challenging analysis questions.<\/p>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<div class=\"aem-Grid aem-Grid--12 aem-Grid--default--12 \">\n<div class=\"cmp-p-container aem-GridColumn aem-GridColumn--default--12\">\n<div id=\"container-d5b6092ccb\" class=\"cmp-container\">\n<div class=\"aem-Grid aem-Grid--12 aem-Grid--default--12 aem-Grid--phone--12 \">\n<div class=\"cmp-p-container p-l1 aem-GridColumn--default--none aem-GridColumn--phone--none aem-GridColumn--phone--12 aem-GridColumn aem-GridColumn--default--6 aem-GridColumn--offset--phone--0 aem-GridColumn--offset--default--0\">\n<div id=\"container-bc33ce055c\" class=\"cmp-container\">\n<div class=\"cmp-p-text mt-l1\">\n<div id=\"text-44194218\" class=\"cmp-text\">\n<div class=\"cmp-sectiontitle\">\n<div class=\"cmp-sectiontitle\">\n<h2 id=\"tem-metrology\" class=\"cmp-sectiontitle__text\" data-anchor-nav-title=\"TEM Metrology \"><span class=\"ez-toc-section\" id=\"TEM_metrology\"><\/span><strong>TEM metrology<\/strong><span class=\"ez-toc-section-end\"><\/span><\/h2>\n<\/div>\n<div class=\"aem-Grid aem-Grid--12 aem-Grid--default--12 aem-Grid--phone--12 \">\n<div class=\"cmp-p-container p-l1 aem-GridColumn--default--none aem-GridColumn--phone--none aem-GridColumn--phone--12 aem-GridColumn aem-GridColumn--default--12 aem-GridColumn--offset--phone--0 aem-GridColumn--offset--default--0\">\n<div id=\"container-4e96203f0c\" class=\"cmp-container\">\n<div class=\"cmp-p-image\">\n<div id=\"image-1043377319\" class=\"cmp-image \" data-cmp-src=\"\/content\/dam\/tfsite\/images\/storefront\/electron-microscopy\/products\/helios-6-hd\/STEM_Metrology.jpg\" data-asset=\"\/content\/dam\/tfsite\/images\/storefront\/electron-microscopy\/products\/helios-6-hd\/STEM_Metrology.jpg\" data-title=\"Stitched STEM image for semiconductor metrology \"><img decoding=\"async\" class=\"cmp-image__image\" title=\"Stitched STEM image for semiconductor metrology \" src=\"https:\/\/www.thermofisher.com\/content\/dam\/tfsite\/images\/storefront\/electron-microscopy\/products\/helios-6-hd\/STEM_Metrology.jpg\" alt=\"Stitched STEM image for semiconductor metrology \" data-cmp-hook-image=\"image\" \/><\/div>\n<\/div>\n<\/div>\n<\/div>\n<div class=\"cmp-p-container p-l1 aem-GridColumn aem-GridColumn--default--12\">\n<div id=\"container-9b0be431ee\" class=\"cmp-container\">\n<div class=\"aem-Grid aem-Grid--12 aem-Grid--default--12 \">\n<div class=\"cmp-p-text mt-l1 aem-GridColumn aem-GridColumn--default--12\">\n<div id=\"text-848082457\" class=\"cmp-text\">\n<p>The Helios 6 HD FIB-SEM generates a high volume of TEM samples in a highly repeatable manner, making it ideally suited for semiconductor TEM reference metrology. The Helios 6 HD FIB-SEM complements the Thermo Scientific Spectra, Talos, and Metrios TEMs, delivering high-efficiency, reliable TEM metrology data.<\/p>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n","protected":false},"excerpt":{"rendered":"<div class=\"cmp-p-container p-l1 aem-GridColumn aem-GridColumn--default--4\">\n<div id=\"container-0e4c317bf6\" class=\"cmp-container\">\n<div class=\"cmp-p-text mt-l1\">\n<div id=\"text-1520806063\" class=\"cmp-text\">\n<h3><strong>Helios 6 HD FIB-SEM meets semiconductor TEM sample preparation growing need<\/strong><\/h3>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<div class=\"cmp-p-container p-l1 aem-GridColumn--default--none aem-GridColumn--phone--none aem-GridColumn aem-GridColumn--phone--4 aem-GridColumn--offset--phone--0 aem-GridColumn--offset--default--0 aem-GridColumn--default--2\">\n<div id=\"container-1e3ce98615\" class=\"cmp-container\">\n<div class=\"cmp-p-text mt-l1\">\n<div id=\"text-1980359783\" class=\"cmp-text\">\n<p>The Thermo Scientific Helios 6 HD Focused Ion Beam Scanning Electron Microscope (FIB-SEM) is designed to meet the industry need for higher volumes of high-quality TEM data for failure analysis and metrology.\u00a0This addition to the Thermo Scientific family of industry-standard DualBeam instruments delivers increased sample quality and productivity, which, in turn, deliver better TEM data. Producing higher quality TEM data provides actionable information to maximize manufacturing yields and end-product quality.<\/p>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n","protected":false},"featured_media":12088,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"rank_math_lock_modified_date":false},"product_cat":[5637],"product_tag":[5678,5680,2344],"class_list":{"0":"post-12090","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-focused-ion-beam-scanning-electron-microscopes-fib-sem","7":"product_tag-focused-ion-beam-scanning-electron-microscope-fib-sem","8":"product_tag-helios-6-hd-en","9":"product_tag-thermo-fisher-scientific-en","10":"yith_product_brand-thermo-fisher-scientific-en","12":"first","13":"instock","14":"shipping-taxable","15":"product-type-simple"},"acf":[],"_links":{"self":[{"href":"https:\/\/gd-1.com\/wp-json\/wp\/v2\/product\/12090"}],"collection":[{"href":"https:\/\/gd-1.com\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/gd-1.com\/wp-json\/wp\/v2\/types\/product"}],"replies":[{"embeddable":true,"href":"https:\/\/gd-1.com\/wp-json\/wp\/v2\/comments?post=12090"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/gd-1.com\/wp-json\/wp\/v2\/media\/12088"}],"wp:attachment":[{"href":"https:\/\/gd-1.com\/wp-json\/wp\/v2\/media?parent=12090"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/gd-1.com\/wp-json\/wp\/v2\/product_cat?post=12090"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/gd-1.com\/wp-json\/wp\/v2\/product_tag?post=12090"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}