{"id":12146,"date":"2024-04-02T03:43:52","date_gmt":"2024-04-02T03:43:52","guid":{"rendered":"https:\/\/gd-1.com\/?post_type=product&#038;p=12146"},"modified":"2024-05-16T08:37:43","modified_gmt":"2024-05-16T08:37:43","slug":"scios-2-focused-ion-beam-scanning-electron-microscope-fib-sem","status":"publish","type":"product","link":"https:\/\/gd-1.com\/en\/san-pham\/scios-2-focused-ion-beam-scanning-electron-microscope-fib-sem\/","title":{"rendered":"Scios 2 &#8211; Focused Ion Beam Scanning Electron Microscope (FIB-SEM)"},"content":{"rendered":"<div id=\"ez-toc-container\" class=\"ez-toc-v2_0_69_1 counter-hierarchy ez-toc-counter ez-toc-grey ez-toc-container-direction\">\n<div class=\"ez-toc-title-container\">\n<label class=\"ez-toc-title ez-toc-toggle\" style=\"cursor:pointer\">T\u00f3m t\u1eaft n\u1ed9i dung<\/label>\n<span class=\"ez-toc-title-toggle\"><a href=\"#\" class=\"ez-toc-pull-right ez-toc-btn ez-toc-btn-xs ez-toc-btn-default ez-toc-toggle\" aria-label=\"Toggle Table of Content\"><span class=\"ez-toc-js-icon-con\"><span class=\"\"><span class=\"eztoc-hide\" style=\"display:none;\">Toggle<\/span><span class=\"ez-toc-icon-toggle-span\"><svg style=\"fill: #0a0a0a;color:#0a0a0a\" xmlns=\"http:\/\/www.w3.org\/2000\/svg\" class=\"list-377408\" width=\"20px\" height=\"20px\" viewBox=\"0 0 24 24\" fill=\"none\"><path d=\"M6 6H4v2h2V6zm14 0H8v2h12V6zM4 11h2v2H4v-2zm16 0H8v2h12v-2zM4 16h2v2H4v-2zm16 0H8v2h12v-2z\" fill=\"currentColor\"><\/path><\/svg><svg style=\"fill: #0a0a0a;color:#0a0a0a\" class=\"arrow-unsorted-368013\" xmlns=\"http:\/\/www.w3.org\/2000\/svg\" width=\"10px\" height=\"10px\" viewBox=\"0 0 24 24\" version=\"1.2\" baseProfile=\"tiny\"><path d=\"M18.2 9.3l-6.2-6.3-6.2 6.3c-.2.2-.3.4-.3.7s.1.5.3.7c.2.2.4.3.7.3h11c.3 0 .5-.1.7-.3.2-.2.3-.5.3-.7s-.1-.5-.3-.7zM5.8 14.7l6.2 6.3 6.2-6.3c.2-.2.3-.5.3-.7s-.1-.5-.3-.7c-.2-.2-.4-.3-.7-.3h-11c-.3 0-.5.1-.7.3-.2.2-.3.5-.3.7s.1.5.3.7z\"\/><\/svg><\/span><\/span><\/span><\/a><\/span><\/div>\n<nav><ul class='ez-toc-list ez-toc-list-level-1 eztoc-toggle-hide-by-default' ><li class='ez-toc-page-1 ez-toc-heading-level-2'><a class=\"ez-toc-link ez-toc-heading-1\" href=\"https:\/\/gd-1.com\/en\/san-pham\/scios-2-focused-ion-beam-scanning-electron-microscope-fib-sem\/#Focused_ion_beam_scanning_electron_microscopy\" title=\"Focused ion beam scanning electron microscopy\">Focused ion beam scanning electron microscopy<\/a><\/li><li class='ez-toc-page-1 ez-toc-heading-level-2'><a class=\"ez-toc-link ez-toc-heading-2\" href=\"https:\/\/gd-1.com\/en\/san-pham\/scios-2-focused-ion-beam-scanning-electron-microscope-fib-sem\/#Subsurface_characterization\" title=\"Subsurface characterization\">Subsurface characterization<\/a><\/li><li class='ez-toc-page-1 ez-toc-heading-level-2'><a class=\"ez-toc-link ez-toc-heading-3\" href=\"https:\/\/gd-1.com\/en\/san-pham\/scios-2-focused-ion-beam-scanning-electron-microscope-fib-sem\/#Backscattered_electron_and_secondary_electron_imaging\" title=\"Backscattered electron and secondary electron imaging\">Backscattered electron and secondary electron imaging<\/a><\/li><li class='ez-toc-page-1 ez-toc-heading-level-2'><a class=\"ez-toc-link ez-toc-heading-4\" href=\"https:\/\/gd-1.com\/en\/san-pham\/scios-2-focused-ion-beam-scanning-electron-microscope-fib-sem\/#TEM_sample_preparation\" title=\"TEM sample preparation\">TEM sample preparation<\/a><\/li><\/ul><\/nav><\/div>\n<h2><span class=\"ez-toc-section\" id=\"Focused_ion_beam_scanning_electron_microscopy\"><\/span><strong>Focused ion beam scanning electron microscopy<\/strong><span class=\"ez-toc-section-end\"><\/span><\/h2>\n<p>The Thermo Scientific Scios 2 DualBeam is an ultra-high-resolution analytical focused ion beam scanning electron microscopy (FIB-SEM) system that provides outstanding sample preparation and 3D characterization performance for a wide range of samples, including magnetic and non-conductive materials. With innovative features designed to increase throughput, precision, and ease of use, the Scios 2 DualBeam is an ideal solution to meet the needs of scientists and engineers in advanced research and analysis across academic, governmental, and industrial research environments.<\/p>\n<h2><span class=\"ez-toc-section\" id=\"Subsurface_characterization\"><\/span><strong>Subsurface characterization<\/strong><span class=\"ez-toc-section-end\"><\/span><\/h2>\n<p>Subsurface or three-dimensional characterization is often required to better understand the structure and properties of a sample. The Scios 2 DualBeam, with optional Thermo Scientific Auto Slice &amp; View 4 (AS&amp;V4) Software, allows for high-quality, fully automated acquisition of multi-modal 3D datasets, including backscattered electron (BSE) imaging for maximum materials contrast, energy-dispersive spectroscopy (EDS) for compositional information, and electron backscatter diffraction (EBSD) for microstructural and crystallographic information. Combined with Thermo Scientific Avizo Software, the Scios 2 DualBeam delivers a unique workflow solution for high-resolution, advanced 3D characterization and analysis at the nanometer scale.<\/p>\n<h2><span class=\"ez-toc-section\" id=\"Backscattered_electron_and_secondary_electron_imaging\"><\/span><strong>Backscattered electron and secondary electron imaging<\/strong><span class=\"ez-toc-section-end\"><\/span><\/h2>\n<p>The innovative NICol electron column provides the foundation of the system\u2019s high-resolution imaging and detection capabilities. It offers excellent nanoscale details, with a wide range of working conditions, whether operating at 30 keV in STEM mode (to access structural information) or at lower energies (to obtain charge-free, detailed surface information). With its unique in-lens Thermo Scientific Trinity Detection System, the Scios 2 DualBeam is designed for simultaneous acquisition of angular and energy-selective secondary electron (SE) and BSE imaging. Fast access to detailed nanoscale information is possible not only top-down, but also on tilted specimens or cross-sections. Optional below-the-lens detectors and an electron-beam-deceleration mode ensure fast and easy simultaneous collection of all signals, revealing the smallest features in a material surface or cross-section. Fast, accurate, and reproducible results are obtained thanks to the unique NICol column design with full auto alignments.<\/p>\n<h2><span class=\"ez-toc-section\" id=\"TEM_sample_preparation\"><\/span><strong>TEM sample preparation<\/strong><span class=\"ez-toc-section-end\"><\/span><\/h2>\n<p>Scientists and engineers constantly face new challenges that require highly localized characterization of increasingly complex samples with ever smaller features. The latest technological innovations of the Scios 2 DualBeam, in combination with the optional, easy-to-use, comprehensive Thermo Scientific AutoTEM 4 Software and Thermo Fisher Scientific\u2019s application expertise, allow for fast and easy preparation of site-specific high-resolution S\/TEM samples for a wide range of materials. In order to achieve high-quality results, final polishing with low-energy ions is required to minimize surface damage on the sample. The Thermo Scientific Sidewinder HT Focused Ion Beam (FIB) column not only delivers high-resolution imaging and milling at high voltages but also offers good low-voltage performance, enabling the creation of high-quality TEM lamella.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Focused ion beam scanning electron microscope for ultra-high resolution, high-quality sample preparation and 3D characterization.<\/p>\n","protected":false},"featured_media":12147,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"rank_math_lock_modified_date":false},"product_cat":[5637],"product_tag":[5678,5733,2344],"class_list":{"0":"post-12146","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-focused-ion-beam-scanning-electron-microscopes-fib-sem","7":"product_tag-focused-ion-beam-scanning-electron-microscope-fib-sem","8":"product_tag-scios-2","9":"product_tag-thermo-fisher-scientific-en","10":"yith_product_brand-thermo-fisher-scientific-en","12":"first","13":"instock","14":"shipping-taxable","15":"product-type-simple"},"acf":[],"_links":{"self":[{"href":"https:\/\/gd-1.com\/wp-json\/wp\/v2\/product\/12146"}],"collection":[{"href":"https:\/\/gd-1.com\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/gd-1.com\/wp-json\/wp\/v2\/types\/product"}],"replies":[{"embeddable":true,"href":"https:\/\/gd-1.com\/wp-json\/wp\/v2\/comments?post=12146"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/gd-1.com\/wp-json\/wp\/v2\/media\/12147"}],"wp:attachment":[{"href":"https:\/\/gd-1.com\/wp-json\/wp\/v2\/media?parent=12146"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/gd-1.com\/wp-json\/wp\/v2\/product_cat?post=12146"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/gd-1.com\/wp-json\/wp\/v2\/product_tag?post=12146"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}