{"id":12215,"date":"2024-04-03T06:52:55","date_gmt":"2024-04-03T06:52:55","guid":{"rendered":"https:\/\/gd-1.com\/?post_type=product&#038;p=12215"},"modified":"2024-04-03T07:06:16","modified_gmt":"2024-04-03T07:06:16","slug":"metrios-6-transmission-electron-microscopy-tem","status":"publish","type":"product","link":"https:\/\/gd-1.com\/en\/san-pham\/metrios-6-transmission-electron-microscopy-tem\/","title":{"rendered":"Metrios 6 &#8211; Transmission Electron Microscopy (TEM)"},"content":{"rendered":"<div id=\"ez-toc-container\" class=\"ez-toc-v2_0_69_1 counter-hierarchy ez-toc-counter ez-toc-grey ez-toc-container-direction\">\n<div class=\"ez-toc-title-container\">\n<label class=\"ez-toc-title ez-toc-toggle\" style=\"cursor:pointer\">T\u00f3m t\u1eaft n\u1ed9i dung<\/label>\n<span class=\"ez-toc-title-toggle\"><a href=\"#\" class=\"ez-toc-pull-right ez-toc-btn ez-toc-btn-xs ez-toc-btn-default ez-toc-toggle\" aria-label=\"Toggle Table of Content\"><span class=\"ez-toc-js-icon-con\"><span class=\"\"><span class=\"eztoc-hide\" style=\"display:none;\">Toggle<\/span><span class=\"ez-toc-icon-toggle-span\"><svg style=\"fill: #0a0a0a;color:#0a0a0a\" xmlns=\"http:\/\/www.w3.org\/2000\/svg\" class=\"list-377408\" width=\"20px\" height=\"20px\" viewBox=\"0 0 24 24\" fill=\"none\"><path d=\"M6 6H4v2h2V6zm14 0H8v2h12V6zM4 11h2v2H4v-2zm16 0H8v2h12v-2zM4 16h2v2H4v-2zm16 0H8v2h12v-2z\" fill=\"currentColor\"><\/path><\/svg><svg style=\"fill: #0a0a0a;color:#0a0a0a\" class=\"arrow-unsorted-368013\" xmlns=\"http:\/\/www.w3.org\/2000\/svg\" width=\"10px\" height=\"10px\" viewBox=\"0 0 24 24\" version=\"1.2\" baseProfile=\"tiny\"><path d=\"M18.2 9.3l-6.2-6.3-6.2 6.3c-.2.2-.3.4-.3.7s.1.5.3.7c.2.2.4.3.7.3h11c.3 0 .5-.1.7-.3.2-.2.3-.5.3-.7s-.1-.5-.3-.7zM5.8 14.7l6.2 6.3 6.2-6.3c.2-.2.3-.5.3-.7s-.1-.5-.3-.7c-.2-.2-.4-.3-.7-.3h-11c-.3 0-.5.1-.7.3-.2.2-.3.5-.3.7s.1.5.3.7z\"\/><\/svg><\/span><\/span><\/span><\/a><\/span><\/div>\n<nav><ul class='ez-toc-list ez-toc-list-level-1 eztoc-toggle-hide-by-default' ><li class='ez-toc-page-1 ez-toc-heading-level-2'><a class=\"ez-toc-link ez-toc-heading-1\" href=\"https:\/\/gd-1.com\/en\/san-pham\/metrios-6-transmission-electron-microscopy-tem\/#Increased_productivity_and_data_integrity\" title=\"Increased productivity and data integrity\">Increased productivity and data integrity<\/a><\/li><li class='ez-toc-page-1 ez-toc-heading-level-2'><a class=\"ez-toc-link ez-toc-heading-2\" href=\"https:\/\/gd-1.com\/en\/san-pham\/metrios-6-transmission-electron-microscopy-tem\/#Fast_elemental_analysis\" title=\"Fast elemental analysis\">Fast elemental analysis<\/a><\/li><li class='ez-toc-page-1 ez-toc-heading-level-2'><a class=\"ez-toc-link ez-toc-heading-3\" href=\"https:\/\/gd-1.com\/en\/san-pham\/metrios-6-transmission-electron-microscopy-tem\/#Recipe-free_automation_for_STEM_metrology\" title=\"Recipe-free automation for (S)TEM metrology\">Recipe-free automation for (S)TEM metrology<\/a><\/li><li class='ez-toc-page-1 ez-toc-heading-level-2'><a class=\"ez-toc-link ez-toc-heading-4\" href=\"https:\/\/gd-1.com\/en\/san-pham\/metrios-6-transmission-electron-microscopy-tem\/#Yield_Ramp_and_Metrology\" title=\"Yield Ramp and Metrology\">Yield Ramp and Metrology<\/a><\/li><li class='ez-toc-page-1 ez-toc-heading-level-2'><a class=\"ez-toc-link ez-toc-heading-5\" href=\"https:\/\/gd-1.com\/en\/san-pham\/metrios-6-transmission-electron-microscopy-tem\/#Physical_and_Chemical_Characterization\" title=\"Physical and Chemical Characterization\">Physical and Chemical Characterization<\/a><\/li><li class='ez-toc-page-1 ez-toc-heading-level-2'><a class=\"ez-toc-link ez-toc-heading-6\" href=\"https:\/\/gd-1.com\/en\/san-pham\/metrios-6-transmission-electron-microscopy-tem\/#Memory_Device_Metrology_and_Analysis\" title=\"Memory Device Metrology and Analysis\">Memory Device Metrology and Analysis<\/a><\/li><\/ul><\/nav><\/div>\n<h2><span class=\"ez-toc-section\" id=\"Increased_productivity_and_data_integrity\"><\/span><strong>Increased productivity and data integrity<\/strong><span class=\"ez-toc-section-end\"><\/span><\/h2>\n<p>Higher sample throughput is enabled by the newly redesigned Smart Stage and the new Ultra-X EDS detection system. These features provide an approximate 15% TEM metrology performance increase and 2x faster EDS elemental analysis. The Smart Stage supports fully automated sample loading and precise navigation to the region of interest (ROI). The new constant power lenses enable high-tension switching in less than 20 minutes, increasing tool availability.<\/p>\n<h2><span class=\"ez-toc-section\" id=\"Fast_elemental_analysis\"><\/span><strong>Fast elemental analysis<\/strong><span class=\"ez-toc-section-end\"><\/span><\/h2>\n<p>The Metrios 6 (S)TEM with the Ultra-X EDS detector brings a new level of EDS detection to high-throughput solutions. The advanced Ultra-X EDS detector provides a 4.45 srad solid angle, delivering at least 2x greater data collection efficiency than the previous generation of detectors. This enables collection of data in less time while preserving the integrity of beam-sensitive samples. In addition to these capabilities, Ultra-X unlocks new EDS analysis opportunities with the cleanest EDS spectra, (&lt;1% spurious peaks).<\/p>\n<h2><span class=\"ez-toc-section\" id=\"Recipe-free_automation_for_STEM_metrology\"><\/span><strong>Recipe-free automation for (S)TEM metrology<\/strong><span class=\"ez-toc-section-end\"><\/span><\/h2>\n<p>Recipe-free, full automation utilizes machine-learning algorithms to substantially reduce automation set-up time for each new process or sample type to provide ease-of-use and scalability. Application-specific Smart Automation supports a variety of semiconductor device types, such as gate-all-around (GAA), DRAM, and 3D NAND. The new web-based segmenter and object detection algorithm provide 50x faster model training on device structures. Additionally, Smart Automation is extensible to meet future advanced semiconductor R&amp;D and manufacturing requirements.<\/p>\n<h2><span class=\"ez-toc-section\" id=\"Yield_Ramp_and_Metrology\"><\/span><strong>Yield Ramp and Metrology<\/strong><span class=\"ez-toc-section-end\"><\/span><\/h2>\n<p>Improving semiconductor yield and accelerating production ramp can be challenging. The increasing 3D complexity of semiconductor devices is generating unprecedented demand for high-quality TEM metrology data. The Metrios 6 (S)TEM features state-of-the-art hardware and machine-learning-based automation software for reference metrology and process monitoring. This solution is designed to help semiconductor labs increase sample throughput and high-volume data acquisition to increase productivity and accelerate time-to-yield.<\/p>\n<h2><span class=\"ez-toc-section\" id=\"Physical_and_Chemical_Characterization\"><\/span><strong>Physical and Chemical Characterization<\/strong><span class=\"ez-toc-section-end\"><\/span><\/h2>\n<p>Developing modern semiconductor devices requires physical, structural, and elemental characterization on atomic-scale defects with special consideration for electron-beam-sensitive materials. The Metrios 6 (S)TEM supports flexible imaging and characterization workflows for accurate root cause analysis and faster process development. Working on beam-sensitive materials depends on enhanced data collection efficiency and minimum electron-beam exposure to preserve data integrity. The Metrios 6 (S)TEM features the Ultra-X EDS detection system and fast high-tension switching for fast physical and elemental characterization of semiconductor devices.<\/p>\n<h2><span class=\"ez-toc-section\" id=\"Memory_Device_Metrology_and_Analysis\"><\/span><strong>Memory Device Metrology and Analysis<\/strong><span class=\"ez-toc-section-end\"><\/span><\/h2>\n<p>Manufacturing advanced memory devices, such as 3D NAND and DRAM, requires high-volume, precision TEM metrology on small, critical dimensions hidden in high-aspect-ratio structures. With fully automated workflows, the Metrios 6 (S)TEM delivers high-productivity, high-quality reference metrology and defect analysis for advanced memory device structures.<\/p>\n","protected":false},"excerpt":{"rendered":"<h2><strong>Fully automated, high-productivity semiconductor metrology workflows<\/strong><\/h2>\n<p>The Thermo Scientific Metrios 6 (S)TEM is a new-generation, fully automated metrology solution with enhanced productivity and data quality for high-volume TEM metrology. Featuring newly designed hardware and machine-learning-based capabilities, the Metrios 6 (S)TEM offers a 20% productivity improvement on average compared to previous-generation solutions.<\/p>\n<p>The Metrios 6 (S)TEM includes the new Smart Stage, the Ultra-X EDS detector, the high-brightness X-CFEG source option, and Smart Automation software. This combination provides improved productivity with data integrity, fast elemental analysis, and recipe-free automation for scalable lab operations and resource optimization.<\/p>\n","protected":false},"featured_media":12216,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"rank_math_lock_modified_date":false},"product_cat":[5633],"product_tag":[5808,2344,5745],"class_list":{"0":"post-12215","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-transmission-electron-microscopy-tem","7":"product_tag-metrios-6","8":"product_tag-thermo-fisher-scientific-en","9":"product_tag-transmission-electron-microscopy-tem","10":"yith_product_brand-thermo-fisher-scientific-en","12":"first","13":"instock","14":"shipping-taxable","15":"product-type-simple"},"acf":[],"_links":{"self":[{"href":"https:\/\/gd-1.com\/wp-json\/wp\/v2\/product\/12215"}],"collection":[{"href":"https:\/\/gd-1.com\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/gd-1.com\/wp-json\/wp\/v2\/types\/product"}],"replies":[{"embeddable":true,"href":"https:\/\/gd-1.com\/wp-json\/wp\/v2\/comments?post=12215"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/gd-1.com\/wp-json\/wp\/v2\/media\/12216"}],"wp:attachment":[{"href":"https:\/\/gd-1.com\/wp-json\/wp\/v2\/media?parent=12215"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/gd-1.com\/wp-json\/wp\/v2\/product_cat?post=12215"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/gd-1.com\/wp-json\/wp\/v2\/product_tag?post=12215"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}