{"id":5637,"count":9,"description":"","link":"https:\/\/gd-1.com\/en\/product-category\/microscopes\/electron-microscopes\/focused-ion-beam-scanning-electron-microscopes-fib-sem\/","name":"Focused Ion Beam Scanning Electron Microscopes (FIB-SEM)","slug":"focused-ion-beam-scanning-electron-microscopes-fib-sem","taxonomy":"product_cat","parent":5990,"meta":[],"acf":[],"_links":{"self":[{"href":"https:\/\/gd-1.com\/wp-json\/wp\/v2\/product_cat\/5637"}],"collection":[{"href":"https:\/\/gd-1.com\/wp-json\/wp\/v2\/product_cat"}],"about":[{"href":"https:\/\/gd-1.com\/wp-json\/wp\/v2\/taxonomies\/product_cat"}],"up":[{"embeddable":true,"href":"https:\/\/gd-1.com\/wp-json\/wp\/v2\/product_cat\/5990"}],"wp:post_type":[{"href":"https:\/\/gd-1.com\/wp-json\/wp\/v2\/product?product_cat=5637"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}