Talos F200X G2 Transmission Electron Microscope
The Thermo Scientific Talos F200X STEM is a scanning transmission electron microscope that combines outstanding high-resolution STEM and TEM imaging with industry-leading energy dispersive X-ray spectroscopy (EDS) signal detection. 2D/3D chemical characterization with compositional mapping is performed by 4 in-column SDD Super-X detectors with unique cleanliness. The Talos F200X scanning transmission electron microscope allows for the fastest and most precise EDS analysis in all dimensions, along with high-resolution TEM and STEM (HRTEM and HRSTEM) imaging with fast navigation for dynamic microscopy. The Talos F200X scanning transmission electron microscope also features reduced environmental sensitivity; the instrument enclosure moderates the impact of air pressure waves, air flows, and fine temperature variations in the TEM room.
STEM imaging and chemical analysis
The Talos F200X (S)TEM delivers fast, precise, quantitative characterization of nanomaterials in multiple dimensions. With innovative features designed to increase throughput, precision, and ease of use, the Talos F200X (S)TEM is ideal for advanced research and analysis in academic, government, semiconductor and industrial environments.
The need for large area correlative imaging at high resolution has recently increased as it allows researchers to preserve the context of their observations while also providing statistically robust data. Thermo Scientific Maps Software (enabled by Thermo Scientific Velox Software) automatically acquires an array of images across a sample and stitches them together to create one large final image. Image acquisition can even be performed unattended. The APW (Automated Particle Workflow) pack has all the benefits described in this section and adds unique processing on a dedicated processing PC with Thermo Scientific Avizo2D Software. You can get nanoparticle parameters like size, area, perimeter, shape, factor, contacts, etc., in an automated way. The fully automated and unattended software pack enables you to use the Talos F200X (S)TEM 24/7, get much better statistics and significantly improve the repeatability because operator bias is not present.
Align Genie Automation Software eases the learning curve for novice operators, reduces tensions in a multi-user environment, and improves time-to-data for the experienced operator.
| HRTEM line resolution |
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| STEM resolution |
- ≤0.16 nm (X-FEG)
- ≤0.14 nm with 100 pA (X-CFEG)
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| Super-X EDS system |
- 4 SDD symmetric design, windowless, shutter-protected
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| Electron energy loss spectroscopy (EELS) energy resolution |
- ≤0.8 eV (X-FEG)
- ≤0.3 eV (X-CFEG
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| Gun brightness at 200 kV |
- 1.8×109 A /cm2 srad (X-FEG)
- 2.4×109 A /cm2 srad (X-CFEG)
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Available with a wide range of high-resolution field emissions guns (FEG)
Choose high-brightness X-FEG, or ultra-high-brightness Cold Field Emission Gun (X-CFEG). X-CFEG combines the best (S)TEM imaging with the best energy resolution.
Intuitive software
Thermo Scientific Velox Software offers fast and easy acquisition and analysis of multimodal data.
Faster time to chemical composition
Rapid, precise quantitative EDS analysis reveals nanoscale details in 2D and 3D with high cleanliness.
Better image data
High throughput STEM imaging with simultaneous, multiple signal detection delivers better contrast for high quality images.
Space for more
Add application-specific in situ sample holders for dynamic experiments.
High-quality (S)TEM images and accurate EDS
Acquire high-quality TEM or STEM images with the innovative and intuitive Velox Software user interface. Unique EDS absorption correction in Velox Software enables highly accurate quantification.
Highly repeatable data collection
All daily TEM tunings, such as focus, eucentric height, beam shift, condenser aperture, beam tilt pivot points and rotation center are automated, ensuring you always start from optimum imaging conditions. Experiments can be repeated reproducibly, allowing you to focus on your research rather than on instrument operation.
Increased productivity
Ultra-stable column and remote operation with the SmartCam Camera and constant-power objective lenses for swift mode and high-voltage (HT) switches. Fast and easy switching for multi-user environments.
Process control using electron microscopy
Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.
Quality control and failure analysis
Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.
Fundamental Materials Research
Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale
Semiconductor research and development
The increasing complexity of semiconductor device structures, along with the shrinking of structural dimensions, means that designing next-generation devices is more challenging and time-consuming than ever before. This, coupled with the fact that the number of technology and design options available is increasing, means a lower probability that any particular design will be commercially successful. As a result, device manufacturers need reliable tools for pathfinding that reduce the number of viable options available and help them implement solutions faster.
Semiconductor metrology
Thermo Fisher Scientific offers a suite of next-generation products with advanced analytical capabilities for semiconductor metrology and inspection. These solutions are designed to help increase productivity in semiconductor fabrication labs by improving quality control and yield in the manufacture of logic, 3D NAND, DRAM, analog, power and display devices.
Semiconductor Failure Analysis
Advanced analytical tools are essential for the detection of any electrical defects that can negatively influence yield, reliability, or performance. With the right equipment, the time and cost associated with electrical fault isolation can be reduced by quickly extracting comprehensive defect data from the sample.
Semiconductor materials characterization
Advanced characterization of these devices can help you deliver on necessary performance, predict and control structural, physical, and chemical properties, as well as correlate your characterization data to parametric test results.
Energy Dispersive Spectroscopy
Energy dispersive spectroscopy (EDS) collects detailed elemental information along with electron microscopy images, providing critical compositional context for EM observations. With EDS, chemical composition can be determined from quick, holistic surface scans down to individual atoms.
3D EDS Tomography
Modern materials research is increasingly reliant on nanoscale analysis in three dimensions. 3D characterization, including compositional data for full chemical and structural context, is possible with 3D EM and energy dispersive X-ray spectroscopy.
EDS Elemental Analysis
Thermo Scientific Phenom Elemental Mapping Software provides fast and reliable information on the distribution of chemical elements within a sample.
Atomic-Scale EDS
Atomic-resolution EDS provides unparalleled chemical context for materials analysis by differentiating the elemental identity of individual atoms. When combined with high-resolution TEM, it is possible to observe the precise organization of atoms in a sample.
Electron Energy Loss Spectroscopy (EELS)
Materials science research benefits from high-resolution EELS for a wide range of analytical applications. This includes high-throughput, high signal-to-noise-ratio elemental mapping, as well as probing of oxidation states and surface phonons.
In Situ experimentation
Direct, real-time observation of microstructural changes with electron microscopy is necessary to understand the underlying principles of dynamic processes such as recrystallization, grain growth, and phase transformation during heating, cooling, and wetting.
Particle analysis
Particle analysis plays a vital role in nanomaterials research and quality control. The nanometer-scale resolution and superior imaging of electron microscopy can be combined with specialized software for rapid characterization of powders and particles.
Multi-scale analysis
Novel materials must be analyzed at ever higher resolution while retaining the larger context of the sample. Multi-scale analysis allows for the correlation of various imaging tools and modalities such as X-ray microCT, DualBeam, Laser PFIB, SEM and TEM.
TEM Metrology
Advanced and automated TEM metrology routines deliver significantly greater precision than manual methods. This allows users to generate large amounts of statistically relevant data, with sub-angstrom-level specificity, that is free of operator bias.
TEM Imaging and Analysis
Thermo Scientific transmission electron microscopes offer high-resolution imaging and analysis of semiconductor devices, enabling manufacturers to calibrate toolsets, diagnose failure mechanisms, and optimize overall process yields.
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